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Indigo Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy | Erin Mills Town Centre
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Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM). The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area. - Demonstrates how to measure quantitatively the composition of coverage of nanoparticles, exploiting the distribution of the nanoparticles into several aggregates - Explains the method for evaluation of the coverage distribution of a substrate by randomly deposited nanoparticles utilizing experimental data provided by scanning probe microscopy techniques - Explains how the methods outlined can be used for a range of spectroscopy applications - Provides great value to both materials scientists and physicists who conduct research in the modeling of cylindrical nanostructures
Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM). The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area. - Demonstrates how to measure quantitatively the composition of coverage of nanoparticles, exploiting the distribution of the nanoparticles into several aggregates - Explains the method for evaluation of the coverage distribution of a substrate by randomly deposited nanoparticles utilizing experimental data provided by scanning probe microscopy techniques - Explains how the methods outlined can be used for a range of spectroscopy applications - Provides great value to both materials scientists and physicists who conduct research in the modeling of cylindrical nanostructures
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